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  • Liquid Surface X-ray
Scattering

   :. Experimental
Capabilities

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Contact: Binhua Lin, +1 630.252.0463, lin@cars.uchicago.edu

15ID-C Liquid Surface Scattering Instrument Capabilities

Energy Range: 8keV - 30keV

Energy Accuracy (ΔE/E): ~10-4

Undulator Source Divergence (µrad)
Horizontal: (2 σ´x) 23
Vertical: (2 σ´y) 6 - 8

Undulator Source Size: (µm)
Horizontal: 2 σ´x 540
Vertical: 2 σ´y 17

Sample table specification
Load: 250Kg
Travel (vertical direction): 400mm
Precision: <±2µm

Typical uncertainties of parameters at 15-ID-C
k uncertainty is in (A-1) units, the angle uncertainties are in radians

 



Δk
 

Δα
 

Δβ
 

Δβ

Δβ

ΔθD

ΔθD

Values



~±10-4k
 

~±10-5
 

~±10-5
 

~±10-4

~±2*10-4/E(keV)

~±10-3

~±2*10-4/E(keV)

Comments



Determined by the Kohzu monochromator

Determined by the incoming beam parameters

For specular reflectivity, where reflected = incoming

For off-specular with small slits

Using Analyzer

Using Soller slits

Using Analyzer

Uncertainties of measurements on 15-ID-C
All q values are given in (A-1) units, energy E in (keV) and the angles in degrees.
Uncertainty values with slits or crystal analyzer are denoted by (SL), and (CA), respectively

Measurement



Specular Reflection
 
 

Off Specular Reflection

Grazing Incidence Diffraction

Range



Geometric limit: ±8
Using Si [1,1,1]: ±4
Using Si [2,2,0]: ±6.54

Uncertainty



Analyzer does not significantly improve resolution in this case, though it reduces background


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