Because the DAFS and XAFS signals have limited photoelectron wavenumber ``bandwidths'', their information content is limited. The number of independent XAFS points is given by , where is the filtering window width in R-space and is the window width in K-space . For typical values, Å and , the number of independent points is approximately 10. This is the maximum number of parameters that can be determined from single shell XAFS data. Note, however, that if there are m inequivalent sites, a set of DAFS measurements for m or more inequivalent reflections can provide up to m times as much information as XAFS. If there are also p components in the sample, and each component has m inequivalent sites, then a total of (pmN) parameters can be determined per shell.