The use of the tensor DANES features to enhance conventional scalar crystallography are discussed by Templeton, Blume, Kirfel, Finkelstein, and Morgenroth et al. in this book. Such x-ray ``tensor crystallography'' using near-edge features is now being widely developed.
The scalar and tensor DAFS information in the extended region can also be incorporated into crystallography. The co-refinement of the diffraction-like and EXAFS-like sensitivities of EDAFS is described below.