Diffraction Anomalous Fine Structure

Diffraction anomalous fine structure (DAFS) is an x-ray spectroscopic technique that combines the long-range order sensitivity of x-ray diffraction (XRD) and the short-range order sensitivity of x-ray absorption fine-structure (XAFS).

  • Review Article: a comprehensive review of DAFS, presented at the International Conference on Anomalous Scattering in Malente, Germany, in 1992.

  • PhD Dissertation of Julie Cross: Analysis of Diffraction Anomalous Fine Structure, in postscript form.

  • DAFS Bibliography: an incomplete list of articles about or using DAFS.

  • DIFFKK: a computer program for calculating x-ray anomalous scattering factors that include DAFS oscillations. Useful in DAFS analysis.

  • Suggestions for and questions about this web site are welcome -- please contact Matt Newville (newville@cars.uchicago.edu) or Julie Olmsted Cross (jox@pnc.aps.anl.gov)

    DAFS Home Page - DAFS Review Paper - Matt Newville - Julie Olmsted Cross