Diffraction Anomalous Fine Structure
Diffraction anomalous fine structure (DAFS) is an x-ray spectroscopic
technique that combines the long-range order sensitivity of x-ray
diffraction (XRD) and the short-range order sensitivity of x-ray absorption
fine-structure (XAFS).
Review Article: a comprehensive review of DAFS,
presented at the International Conference on Anomalous Scattering in
Malente, Germany, in 1992.
PhD Dissertation of Julie Cross: Analysis
of Diffraction Anomalous Fine Structure, in postscript form.
DAFS Bibliography: an incomplete list of
articles about or using DAFS.
DIFFKK: a computer program for calculating
x-ray anomalous scattering factors that include DAFS oscillations. Useful
in DAFS analysis.
Suggestions for and questions about this web site are welcome -- please
contact Matt Newville
(newville@cars.uchicago.edu) or
Julie Olmsted Cross
(jox@pnc.aps.anl.gov)
DAFS Home Page
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DAFS Review Paper
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Matt Newville
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Julie Olmsted Cross